Publication venue 'Elsevier BV'
Publication date 01/09/2018
Field of study Get PDF
Publication venue 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date 01/06/2020
Field of study Get PDF
Publication venue 'Elsevier BV'
Publication date 01/01/2017
Field of study Get PDF
Publication venue 'Elsevier BV'
Publication date 01/09/2018
Field of study Get PDF
Publication venue 'Elsevier BV'
Publication date 01/09/2018
Field of study Get PDF
Publication venue 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date 01/05/2020
Field of study Get PDF
Publication venue 'World Scientific Pub Co Pte Lt'
Publication date 01/09/2013
Field of study Full text link The radiation hardness of commercial Silicon Carbide and Gallium Nitride
power MOSFETs is presented in this paper, for Total Ionizing Dose effects and
Single Event Effects, under gamma, neutrons, protons and heavy ions. Similar
tests are discussed for commercial DC-DC converters, also tested in operation
under magnetic field
Publication venue 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date 01/07/2021
Field of study Get PDF
Publication venue 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date 01/01/2020
Field of study Get PDF
Publication venue 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date 01/06/2020
Field of study Get PDF